Schottky Field Emission Scanning Electron Microscope

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FE-SEM  SU5000  

A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the sample’s surface, morphology, topography, measurement size and composition.


Magnification 10-600,000x
Electron Optics: Emitter ZrO / W Schottky emitter, Acceleration Voltage: 0.1-30 kV (0.1 kV step)
Variable Pressure Mode Low vacuum mode Pressure Range 10-300 Pa
Detectors Top detector, Lower detector, Ultra Variable-Pressure Detector (UVD), Backscatter Electron Detector(BSE), Energy Dispersive X-ray detector (EDS)
Type of sample Solid, powder, thin film, nanoparticles, polymer, Fiber , biomaterial with coating Au, Pt, biological sample, non-conductive materials