Schottky Field Emission Scanning Electron Microscope
FE-SEM SU8030
A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning it with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the sample’s surface , morphology, topography, measurement size and analysis determined chemical compositions and distribution
Specifications
| Magnification | 20X to 800,000X |
|---|---|
| Electron Optics: Emitter | Electron gun Cold cathode field emission source, Anode heating system, Accelerating voltage : 0. 1 - 30 kV |
| Detectors | Top/Upper/Lower, PDBSE, Energy Dispersive X-ray spectrometer (EDX) |
| Type of sample | Solid, powder, thin film, nanoparticles, polymer, fiber, biomaterial with coating Au, Pt |
Application
Materials Science
Life Sciences
Semiconductor / Electronics
Industry
Materials Science
Life Sciences
Semiconductor / Electronics
Industry