Schottky Field Emission Scanning Electron Microscope

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A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning it with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the sample’s surface , morphology, topography, measurement size and analysis determined chemical compositions and distribution


Magnification 20X to 800,000X
Electron Optics: Emitter Electron gun Cold cathode field emission source, Anode heating system, Accelerating voltage : 0. 1 - 30 kV
Detectors Top/Upper/Lower, PDBSE, Energy Dispersive X-ray spectrometer (EDX)
Type of sample Solid, powder, thin film, nanoparticles, polymer, fiber, biomaterial with coating Au, Pt