Micro Energy Dispersive X-ray Fluorescence Spectrometer (µ-EDXRF)


Orbis PC

The specimen is excited with the primary X-radiation. In the process electrons from the inner electron shells are knocked. Electrons from outer electron shells fill the resultant voids emitting a fluorescence radiation that is characteristic in its energy distribution for a particular material. This fluorescence radiation is evaluated by the detector.


  • Analyze elements from Sodium (Na) to Uranium (U) in concentration ranges from 100 wt% to 10 ppm levels.
  • Non-destructive and no lasting influence on the material.
  • Able to provide up to three different X-ray beam sizes: 30 µm, 1 mm and 2 mm.
  • Method needs very simple sample preparation and short measurement times range in the seconds, rarely longer than one minute.
  • Eliminate loss in signal intensity even the sample surface is rough.